Sciaps X-50 Handheld Xrf Analyzer
Sciaps X-50 Handheld Xrf Analyzer features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x – 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 70 eV less (greater width). However, for many applications, such as basic sorting of stainless, high temp, and copper alloys, or to analyze base or heavy metals in soils, ores, powders, etc., the PiN technology is satisfactory.
Detector Rate: 7 mm2 PIN Diode, Standard DPP, 15k cps, 50% live
3.3 lbs with battery
6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.
Fundamental parameters. For Geochem and Env. Soil Apps, users may also choose “Compton Normalization” method and/ or use empirically derived calibrations.
7.25″ x 10.5″ x 4.5″
7mm2 PiN diode detector (active area), 190eV resolution FWHM at 5.95Mn K-alpha line.
Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.
On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time).
6 position filter wheel for beam optimization.
Environmental Temp. Range
10°F to 130°F at 25% duty cycle.
5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic.
Processing Electronics Host Processor
ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD
Password protected usage (user level) and internal settings (admin).
Comms/ Data Transfer
Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software.
14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor Digital Filtering implemented in FPGA for high throughput pulse processing 50nS – 24uS peaking time
CE, RoHS, USFDA registered, Canada RED Act.